Kanazawa University NanoLSI Podcast

Atomic force microscopy in 3D

4 min · 24. Okt. 2024
Episode Atomic force microscopy in 3D Cover

Beschreibung

M.S. Alam et al, Small Methods 2024, 2400287 Atomic force microscopy (AFM) was initially developed to visualize surfaces at nanoscale resolution. Researchers at WPI NanoLSI, Kanazawa University, have now extended AFM for 3D imaging, particularly for flexible nanostructures like carbon nanotubes. They demonstrated that dynamic mode AFM, which uses a vibrating tip, causes less friction and damage than static mode, making it ideal for imaging delicate biological systems like cells, organelles, and vesicles .  NanoLSI Podcast website [https://nanolsi.kanazawa-u.ac.jp/en/announcements/nanolsipodcast/]

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